Test cost reduction for system-on-a-chip using design for testability technique

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Material Type: 博士論文
Title: Test cost reduction for system-on-a-chip using design for testability technique
Author/Editor: Gang Zeng [著]
Author Heading: 曾, 剛ソ, ゴウ
Publication, Distribution, etc.: [Gang Zeng]
Publication Date: 2006
Publication Date (W3CDTF): 2006
Extent: 1冊
Alternative Title: テスト容易化設計手法によるシステムオンチップのテストコストの削減テストヨウイカセッケイシュホウニヨルシステムオンチップノテストコストノサクゲン
Degree grantor/type: 千葉大学
Date Granted: 平成18年3月24日
Date Granted (W3CDTF): 2006
Dissertation Number: 甲第3249号
Degree Type: 博士 (工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: eng
Alias of Author: Zeng, Gang
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2006-M186
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008346713
http://id.ndl.go.jp/bib/000008346713
Bibliographic Record Category (NDL): 213