Proceedings of the 2005 IEEE international symposium on workload characterization : IISWC-2005 : October 6-8, 2005 : Austin, Texas. : IISWC : Oct 2005, Austin, TX.

Call No. (NDL): M17-07-79
Bibliographic ID of National Diet Library: 000008384943

Material type: 図書

Author: IEEE International Symposium on Workload Characterization (2005 : Austin, Tex.)

Publisher: IEEE

Publication date: c2005.

Material Format: Paper

Capacity, size, etc.: viii, 204 p. : ill. ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Abstracts and selected papers."This is a special year for this symposium because it is its first year in this format. This forum started as a workshop...

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Paper

Material Type: 図書
ISBN: 0780394615
Title: Proceedings of the 2005 IEEE international symposium on workload characterization : IISWC-2005 : October 6-8, 2005 : Austin, Texas. : IISWC : Oct 2005, Austin, TX.
Author Heading: IEEE International Symposium on Workload Characterization (2005 : Austin, Tex.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2005.
Publication Date (W3CDTF): 2005
Extent: viii, 204 p. : ill. ; 28 cm.
Alternative Title: IISWC-2005: IEEE international symposium on workload characterization
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Electronic digital computers -- Evaluation -- Congresses.
Electronic digital computers -- Workload -- Congresses.
Computer networks -- Workload -- Congresses.
System design -- Congresses.
NDLC: M17
Note (General): Abstracts and selected papers.
"This is a special year for this symposium because it is its first year in this format. This forum started as a workshop, (...) " -- p. iii.
IEEE cat no 05EX1195.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-07-79
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008384943
http://id.ndl.go.jp/bib/000008384943
LC Control Number: 2005932179
https://lccn.loc.gov/2005932179
RLIN No.: CSUGA6282221-B
Bibliographic Record Category (NDL): 215