2006 IEEE international integrated reliability workshop final report : Stanford Sierra Conference Center : S. Lake Tahoe, California : October 16-19, 2006. : 25th IEEE international integrated reliability workshop (IIRW) : Oct 2006, ------.

2006 IEEE international integrated reliability workshop final report : Stanford Sierra Conference Center : S. Lake Tahoe, California : October 16-19, 2006. : 25th IEEE international integrated reliability workshop (IIRW) : Oct 2006, ------.

Call No. (NDL): M17-07-646
Bibliographic ID of National Diet Library: 000008453150

Material type: 図書

Author: -

Publisher: IEEE Electron Devices Society

Publication date: c2006.

Material Format: Paper

Capacity, size, etc.: vi, 230 p. : ill. ; 28 cm.

NDC: -

View All

Notes on use

Note (General)：: Papers and abstracts.Held at S. Lake Tahoe, CA, USA.IEEE cat no 06TH8877.

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 1424402964 (softbound ed.)
ISSN: 1930-8841
Title: 2006 IEEE international integrated reliability workshop final report : Stanford Sierra Conference Center : S. Lake Tahoe, California : October 16-19, 2006. : 25th IEEE international integrated reliability workshop (IIRW) : Oct 2006, ------.
Publication, Distribution, etc.: [Piscataway] : IEEE Electron Devices Society
[Piscataway] : IEEE Reliability Society
Publication Date: c2006.
Publication Date (W3CDTF): 2006
Extent: vi, 230 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
NDLC: M17
Note (General): Papers and abstracts.
Held at S. Lake Tahoe, CA, USA.
IEEE cat no 06TH8877.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-07-646
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008453150
http://id.ndl.go.jp/bib/000008453150
Bibliographic Record Category (NDL): 215