Quantitative analysis of ultrathin films using high-angle annular dark field scanning transmission electron microscopy

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Material Type: 博士論文
Title: Quantitative analysis of ultrathin films using high-angle annular dark field scanning transmission electron microscopy
Author/Editor: Nobuto Nakanishi [著]
Author Heading: 中西, 伸登ナカニシ, ノブト
Publication, Distribution, etc.: [Nobuto Nakanishi]
Publication Date: [2006]
Publication Date (W3CDTF): 2006
Extent: 1冊
Alternative Title: 高角度環状暗視野走査透過型電子顕微鏡法による極薄膜の定量解析コウカクドカンジョウアンシヤソウサトウカガタデンシケンビキョウホウニヨルキョクハクマクノテイリョウカイセキ
Degree grantor/type: 東京理科大学
Date Granted: 平成18年3月20日
Date Granted (W3CDTF): 2006
Dissertation Number: 甲第666号
Degree Type: 博士 (理学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: eng
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2007-B872
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008496202
http://id.ndl.go.jp/bib/000008496202
Bibliographic Record Category (NDL): 213