SEMI presents 8th European manufacturing test conference : April 4, 2006 : SEMICON Europa 2006 : Munich, Germany. : 8th European manufacturing test conference (EMTC) "probing the future of manufacturing test" : Apr 2006, Munich, Germany.

SEMI presents 8th European manufacturing test conference : April 4, 2006 : SEMICON Europa 2006 : Munich, Germany. : 8th European manufacturing test conference (EMTC) "probing the future of manufacturing test" : Apr 2006, Munich, Germany.

Call No. (NDL): M17-07-861
Bibliographic ID of National Diet Library: 000008516009

Material type: 図書

Author: Semiconductor Equipment and Materials International (SEMI)

Publisher: -

Publication date: c2006.

Material Format: Paper

Capacity, size, etc.: v.

NDC: -

View All

Notes on use

Note (General)：: Program and presentations.

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
Title: SEMI presents 8th European manufacturing test conference : April 4, 2006 : SEMICON Europa 2006 : Munich, Germany. : 8th European manufacturing test conference (EMTC) "probing the future of manufacturing test" : Apr 2006, Munich, Germany.
Author Heading: Semiconductor Equipment and Materials International (SEMI)
Publication Date: c2006.
Publication Date (W3CDTF): 2006
Extent: v.
Alternative Title: 8th European manufacturing test conference : Tuesday 4 April 2006 : ICM -- International Congress Centre : Munich, Germany : EMTC
30 years : SEMICON Europa2006
NDLC: M17
Note (General): Program and presentations.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-07-861
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008516009
http://id.ndl.go.jp/bib/000008516009
Bibliographic Record Category (NDL): 215