図書

Proceedings of the 15th Asian test symposium : 20-23 November 2006, Fukuoka, Japan. : silicon debug and diagnosis workshop 2006 : Nov 2006, Fukuoka, Japan.

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Proceedings of the 15th Asian test symposium : 20-23 November 2006, Fukuoka, Japan. : silicon debug and diagnosis workshop 2006 : Nov 2006, Fukuoka, Japan.

Call No. (NDL)
M17-07-1079
Bibliographic ID of National Diet Library
000008521905
Material type
図書
Author
Asian Test Symposium (15th : 2006 : Fukuoka-shi, Japan)
Publisher
IEEE Computer Society
Publication date
c2006.
Material Format
Paper
Capacity, size, etc.
xxiii, 451 p. : ill. ; 28 cm.
NDC
-
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Notes on use

Note (General):

Papers and abstracts." (...) ATS has been held every year in various Asian cities (...) " -- foreword.IEEE cat no P2628 (t.p. verso) , PR2628 (cover &...

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Paper

Material Type
図書
ISBN
0769526284
9780769526287 (ISBN-13)
ISSN
1081-7735
Publication, Distribution, etc.
Publication Date
c2006.
Publication Date (W3CDTF)
2006
Extent
xxiii, 451 p. : ill. ; 28 cm.
Alternative Title
15th Asian test symposium : (ATS 2006) : Fukuoka, Japan : 20-23 November 2006