Proceedings of the 15th Asian test symposium : 20-23 November 2006, Fukuoka, Japan. : silicon debug and diagnosis workshop 2006 : Nov 2006, Fukuoka, Japan.

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Note (General)：: Papers and abstracts." (...) ATS has been held every year in various Asian cities (...) " -- foreword.IEEE cat no P2628 (t.p. verso) , PR2628 (cover &...

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Material Type: 図書
ISBN: 0769526284
9780769526287 (ISBN-13)
ISSN: 1081-7735
Title: Proceedings of the 15th Asian test symposium : 20-23 November 2006, Fukuoka, Japan. : silicon debug and diagnosis workshop 2006 : Nov 2006, Fukuoka, Japan.
Author Heading: Asian Test Symposium (15th : 2006 : Fukuoka-shi, Japan)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2006.
Publication Date (W3CDTF): 2006
Extent: xxiii, 451 p. : ill. ; 28 cm.
Alternative Title: 15th Asian test symposium : (ATS 2006) : Fukuoka, Japan : 20-23 November 2006
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Electronic digital computers -- Circuits -- Testing -- Congresses.
Electronic circuits -- Testing -- Congresses.
Fault-tolerant computing -- Congresses.
NDLC: M17
Note (General): Papers and abstracts.
" (...) ATS has been held every year in various Asian cities (...) " -- foreword.
IEEE cat no P2628 (t.p. verso) , PR2628 (cover & spine) .
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-07-1079
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008521905
http://id.ndl.go.jp/bib/000008521905
OCLC No.: 127022342
https://www.worldcat.org/oclc/127022342
Bibliographic Record Category (NDL): 215