Machine vision applications in industrial inspection 15 : 29-30 January 2007 : San Jose, California, USA. : Jan 2007, San Jose, CA. (SPIE Proceedings ; 6503)

Machine vision applications in industrial inspection 15 : 29-30 January 2007 : San Jose, California, USA. : Jan 2007, San Jose, CA.

(SPIE Proceedings ; 6503)

Call No. (NDL): M17-07-1317
Bibliographic ID of National Diet Library: 000008562774

Material type: 図書

Author: Mériaudeau, Fabrice.ほか

Publisher: SPIE

Publication date: c2007.

Material Format: Paper

Capacity, size, etc.: 1 v. (various pagings) : ill. ; 28 cm.

NDC: -

View All

Notes on use

Note (General)：: Papers.

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

List of Cooperating Institutions and Databases

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Paper
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 9780819466167
ISSN (series): 0277-786X
Title: Machine vision applications in industrial inspection 15 : 29-30 January 2007 : San Jose, California, USA. : Jan 2007, San Jose, CA.
Series Title: SPIE Proceedings ; 6503
Title Heading: Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology.
Proceedings of SPIE -- the International Society for Optical Engineering ; v. 6503.
Author Heading: Mériaudeau, Fabrice.
Niel, Kurt S.
Publication, Distribution, etc.: Bellingham : SPIE
Springfield : IS&T
Publication Date: c2007.
Publication Date (W3CDTF): 2007
Extent: 1 v. (various pagings) : ill. ; 28 cm.
Alternative Title: Proceedings of electronic imaging science and technology
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Engineering inspection -- Automation -- Congresses.
Computer vision -- Industrial applications -- Congresses.
Quality control -- Optical methods -- Automation -- Congresses.
Measurement -- Congresses.
LCC: TS156.2
DDC: 670.42/5
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-07-1317
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008562774
http://id.ndl.go.jp/bib/000008562774
OCLC No.: 85768137
https://www.worldcat.org/oclc/85768137
Bibliographic Record Category (NDL): 215