Technologies for synthetic environments: hardware-in-the-loop testing 12 : 10 April 2007 : Orlando, Florida, USA. : Apr 2007, Orlando, FL. (SPIE Proceedings ; 6544)

Technologies for synthetic environments: hardware-in-the-loop testing 12 : 10 April 2007 : Orlando, Florida, USA. : Apr 2007, Orlando, FL.

(SPIE Proceedings ; 6544)

Call No. (NDL): M17-07-1720
Bibliographic ID of National Diet Library: 000008716008

Material type: 図書

Author: Murrer, Robert Lee.

Publisher: SPIE

Publication date: c2007.

Material Format: Paper

Capacity, size, etc.: 1 v. (various pagings) : ill. ; 28 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN: 9780819466662
ISSN (series): 0277-786X
Title: Technologies for synthetic environments: hardware-in-the-loop testing 12 : 10 April 2007 : Orlando, Florida, USA. : Apr 2007, Orlando, FL.
Series Title: SPIE Proceedings ; 6544
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 6544.
Author Heading: Murrer, Robert Lee.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2007.
Publication Date (W3CDTF): 2007
Extent: 1 v. (various pagings) : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Guided missiles -- Testing -- Congresses.
Infrared detectors -- Congresses.
Guidance systems (Flight) -- Congresses.
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-07-1720
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008716008
http://id.ndl.go.jp/bib/000008716008
OCLC No.: 144810276
https://www.worldcat.org/oclc/144810276
Bibliographic Record Category (NDL): 215