Analytical techniques for semiconductor materials and process characterization 5 : (ALTECH 2007) : September 13-14, 2007 : Munich, Germany. : ALTECH 07 symposium analytical techniques for semiconductor materials and process characterization 5 : solid state device research conference (ESSDERC) 2007 : Sep 2007, Munich, Germany. (ECS Transactions ; 10 (no. 1))

Analytical techniques for semiconductor materials and process characterization 5 : (ALTECH 2007) : September 13-14, 2007 : Munich, Germany. : ALTECH 07 symposium analytical techniques for semiconductor materials and process characterization 5 : solid state device research conference (ESSDERC) 2007 : Sep 2007, Munich, Germany.

(ECS Transactions ; 10 (no. 1))

Call No. (NDL): M17-08-963
Bibliographic ID of National Diet Library: 000009327285

Material type: 図書

Author: Electrochemical Society. Electronics Division. European Committee.

Publisher: Electrochemical Society

Publication date: c2007.

Material Format: Paper

Capacity, size, etc.: 161 p. : ill. ; 24 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN: 9781604238259
Title: Analytical techniques for semiconductor materials and process characterization 5 : (ALTECH 2007) : September 13-14, 2007 : Munich, Germany. : ALTECH 07 symposium analytical techniques for semiconductor materials and process characterization 5 : solid state device research conference (ESSDERC) 2007 : Sep 2007, Munich, Germany.
Series Title: ECS Transactions ; 10 (no. 1)
Author Heading: Electrochemical Society. Electronics Division. European Committee.
Publication, Distribution, etc.: Pennington : Electrochemical Society
Publication Date: c2007.
Publication Date (W3CDTF): 2007
Extent: 161 p. : ill. ; 24 cm.
Place of Publication (Country Code): US
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-08-963
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009327285
http://id.ndl.go.jp/bib/000009327285
Bibliographic Record Category (NDL): 215