図書

Quantum electronics metrology : 20-21 January 2008 : San Jose, California, USA. : conference on quantum electronics metrology (QEM) : conference on advances in slow and fast light : Jan 2008, San Jose, CA. (SPIE Proceedings ; 6906)

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Quantum electronics metrology : 20-21 January 2008 : San Jose, California, USA. : conference on quantum electronics metrology (QEM) : conference on advances in slow and fast light : Jan 2008, San Jose, CA.

(SPIE Proceedings ; 6906)

Call No. (NDL)
M17-08-991
Bibliographic ID of National Diet Library
000009327986
Material type
図書
Author
Craig, Alan Ellsworth.ほか
Publisher
SPIE
Publication date
c2008.
Material Format
Paper
Capacity, size, etc.
1 v. (various pagings) : ill. ; 28 cm.
NDC
-
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Notes on use

Note (General)：

Papers."This proceedings volume records the inaugural meeting of the conference on Quantum Electronics Metrology (QEM) ." -- introd.

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Paper

Material Type
図書
ISBN
9780819470812
ISSN (series)
0277-786X
Title
Quantum electronics metrology : 20-21 January 2008 : San Jose, California, USA. : conference on quantum electronics metrology (QEM) : conference on advances in slow and fast light : Jan 2008, San Jose, CA.
Series Title
SPIE Proceedings ; 6906
Title Heading
Proceedings of SPIE -- the International Society for Optical Engineering ; v. 6906.
Author Heading
Craig, Alan Ellsworth.
Shahriar, Selim M.
Publication, Distribution, etc.
Bellingham : SPIE
Publication Date
c2008.
Publication Date (W3CDTF)
2008