The 22nd IEEE international symposium on defect and fault-tolerance in VLSI systems : DFT 2007 : proceedings : 26-28 September 2007 : Rome, Italy. : Sep 2007, Rome, Italy.

• Material Type: 図書
• ISBN: 0769528856
• ISSN: 1550-5774
• Title: The 22nd IEEE international symposium on defect and fault-tolerance in VLSI systems : DFT 2007 : proceedings : 26-28 September 2007 : Rome, Italy. : Sep 2007, Rome, Italy.
• Author Heading: Bolchini, Cristiana.; IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (22nd : 2007 : Rome, Italy)
• Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
• Publication Date: [c2007]
• Publication Date (W3CDTF): 2007
• Extent: xiv, 537 p. : ill. ; 28 cm.
• Alternative Title: 22nd IEEE international symposium on defect and fault tolerance in VLSI systems : (DFT 2007) : Rome, Italy : 26-28 September 2007
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Fault-tolerant computing -- Congresses.
• LCC: TK7874
• DDC: 621.39/5
• NDLC: M17
• Note (General): Papers.; IEEE cat no P2885 (t.p. verso) , PR2885 (cover & spine) .
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-09-22
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000009774422; http://id.ndl.go.jp/bib/000009774422
• LC Control Number: 2007931917; https://lccn.loc.gov/2007931917
• OCLC No.: 181735146; https://www.worldcat.org/oclc/181735146
• Bibliographic Record Category (NDL): 215