Proceedings of 2008 Asia-Pacific symposium on electromagnetic compatibility and 19th international Zurich symposium on electromagnetic compatibility : proceedings : 19-22 May 2008 : Singapore. : May 2008, Singapore.

Proceedings of 2008 Asia-Pacific symposium on electromagnetic compatibility and 19th international Zurich symposium on electromagnetic compatibility : proceedings : 19-22 May 2008 : Singapore. : May 2008, Singapore.

Call No. (NDL): M17-09-353
Bibliographic ID of National Diet Library: 000009784823

Material type: 図書

Author: Institute of High Performance Computing (Singapore)ほか

Publisher: Research Publishing Services

Publication date: c2008.

Material Format: Paper

Capacity, size, etc.: xxiv, 956 p. : ill. ; 28 cm.

NDC: -

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Note (General)：: Program and papers."A three day International exhibition on the state-of-the-art EMC and RF/Microwave Measurements and Instrumentation further complem...

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Paper

Material Type: 図書
ISBN: 9789810806286 (pbk.)
Title: Proceedings of 2008 Asia-Pacific symposium on electromagnetic compatibility and 19th international Zurich symposium on electromagnetic compatibility : proceedings : 19-22 May 2008 : Singapore. : May 2008, Singapore.
Author Heading: Institute of High Performance Computing (Singapore)
Li, Er-Ping.
Asia-Pacific Symposium on Electromagnetic Compatibility (2008 : Singapore)
International Zurich Symposium on Electromagnetic Compatibility (19th : 2008 : Singapore)
Publication, Distribution, etc.: Singapore : Research Publishing Services
Publication Date: c2008.
Publication Date (W3CDTF): 2008
Extent: xxiv, 956 p. : ill. ; 28 cm.
Alternative Title: EMC Zurich Singapore 2008
EMC APEMC Singapore 2008
EMC-in-Singapore 2008 : the gateway to emerging technologies
Place of Publication (Country Code): SG
Text Language Code: eng
Subject Heading: Electromagnetic compatibility -- Congresses.
Electromagnetic fields -- Congresses.
DDC: 621.38224
NDLC: M17
Note (General): Program and papers.
"A three day International exhibition on the state-of-the-art EMC and RF/Microwave Measurements and Instrumentation further complements the symposium." -- p. iii.
IEEE cat no 08EX2004.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-09-353
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009784823
http://id.ndl.go.jp/bib/000009784823
OCLC No.: 232307504
https://www.worldcat.org/oclc/232307504
Bibliographic Record Category (NDL): 215