Focused ion beams for materials characterization and micromachining : March 24-28, 2008 : San Francisco, California, USA. : Mar 2008, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1089)

Focused ion beams for materials characterization and micromachining : March 24-28, 2008 : San Francisco, California, USA. : Mar 2008, San Francisco, CA.

(Materials Research Society Symposia Proceedings ; 1089)

Call No. (NDL): M17-09-2070
Bibliographic ID of National Diet Library: 000010154282

Material type: 図書

Author: Materials Research Society. Meeting (2008 : San Francisco, Calif.)

Publisher: Materials Research Society

Publication date: c2008.

Material Format: Paper

Capacity, size, etc.: 23 p. : ill. ; 24 cm.

NDC: -

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Notes on use

Note (General)：: Papers."Spring 2008" -- cover.

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Paper

Material Type: 図書
ISBN: 9781605608761
Title: Focused ion beams for materials characterization and micromachining : March 24-28, 2008 : San Francisco, California, USA. : Mar 2008, San Francisco, CA.
Series Title: Materials Research Society Symposia Proceedings ; 1089
Title Heading: Materials Research Society symposia proceedings ; v. 1089.
Author Heading: Materials Research Society. Meeting (2008 : San Francisco, Calif.)
Publication, Distribution, etc.: Warrendale : Materials Research Society
Publication Date: c2008.
Publication Date (W3CDTF): 2008
Extent: 23 p. : ill. ; 24 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Focused ion beams -- Industrial applications -- Congresses.
Micromachining -- Materials -- Congresses.
LCC: QC702.7.B65
NDLC: M17
Note (General): Papers.
"Spring 2008" -- cover.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-09-2070
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010154282
http://id.ndl.go.jp/bib/000010154282
OCLC No.: 320936657
https://www.worldcat.org/oclc/320936657
Bibliographic Record Category (NDL): 215