2005 IEEE international test conference (ITC) : 8-10 November, 2005 : Austin, TX. : Nov 2005, Austin, TX.

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Material Type: 図書
ISBN: 0780390393
ISBN (set): 0780390385 (set)
ISSN: 1089-3539
Title: 2005 IEEE international test conference (ITC) : 8-10 November, 2005 : Austin, TX. : Nov 2005, Austin, TX.
Author Heading: International Test Conference (2005 : Austin, Texas.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2005.
Publication Date (W3CDTF): 2005
Extent: 2 v. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Testing -- Congresses.
Semiconductors -- Testing -- Congresses.
Electronics -- Congresses.
LCC: TK7874
DDC: 621.3815/48
NDLC: M17
Note (General): Papers.
IEEE cat no 05CH37661.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-10-182
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010335939
http://id.ndl.go.jp/bib/000010335939
LC Control Number: 2006280338
https://lccn.loc.gov/2006280338
OCLC No.: 64704533
https://www.worldcat.org/oclc/64704533
Bibliographic Record Category (NDL): 215