Optical measurement systems for industrial inspection 6 : 15-18 June 2009 : Munich, Germany. : Jun 2009, Munich, Germany. (SPIE Proceedings ; 7389)

Optical measurement systems for industrial inspection 6 : 15-18 June 2009 : Munich, Germany. : Jun 2009, Munich, Germany.

(SPIE Proceedings ; 7389)

Notes on use

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
ISBN (set): 9780819476722 (set)
ISSN (series): 0277-786X
Title: Optical measurement systems for industrial inspection 6 : 15-18 June 2009 : Munich, Germany. : Jun 2009, Munich, Germany.
Series Title: SPIE Proceedings ; 7389
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 7389.
Author Heading: European Optical Society (EOS)
Lehmann, Peter H.
Wissenschaftliche Gesellschaft Lasertechnik (WLT)
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2009.
Publication Date (W3CDTF): 2009
Extent: 2 parts : ill. (some col.) ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Quality control -- Optical methods -- Congresses.
Optical instruments -- Industrial applications -- Congresses.
Optical detectors -- Industrial applications -- Congresses.
LCC: QC367
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-10-1043
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010579614
http://id.ndl.go.jp/bib/000010579614
OCLC No.: 439881019
https://www.worldcat.org/oclc/439881019
Bibliographic Record Category (NDL): 215