A landmark-based method for the geometrical 3D calibration of scanning microscopes (BAM-Dissertationsreihe ; 21)

A landmark-based method for the geometrical 3D calibration of scanning microscopes

(BAM-Dissertationsreihe ; 21)

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Material Type: 博士論文
ISBN: 978-3-86509-630-2
ISSN (series): 1613-4249
Title: A landmark-based method for the geometrical 3D calibration of scanning microscopes
Author/Editor: Martin Ritter.
Series Title: BAM-Dissertationsreihe ; 21
Author Heading: Ritter, Martin.
Publication, Distribution, etc.: Berlin : Technische Universitat Berlin
Publication Date: 2007.
Extent: xi, 131 p.
Degree grantor/type: Technische Universitat Berlin
Date Granted: 2007.
Date Granted (W3CDTF): 2007
Note (Dissertation): 博士論文
Thesis (doctoral) --Technische Universitat Berlin, 2007.
Place of Publication (Country Code): DE
Text Language Code: eng
Note (Bibliography): Includes bibliographies.
Summary in English and German.
Holding library: 国立国会図書館
Call No.: M-DIGBE-2311
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010669308
http://id.ndl.go.jp/bib/000010669308
Bibliographic Record Category (NDL): 216