電子回路基板のリユース信頼性予測

電子回路基板のリユース信頼性予測

Call No. (NDL): UT51-2009-P607
Bibliographic ID of National Diet Library: 000010695631

Material type: 博士論文

Author: 太田周一 [著]

Publisher: [太田周一]

Publication date: [2009]

Material Format: Paper

Capacity, size, etc.: 1冊

Name of awarding university/degree: 電気通信大学,博士 (工学)

Notes on use

Note (General)：: 博士論文

Accompanying material：: 要旨1枚

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Paper

Material Type: 博士論文
Title: 電子回路基板のリユース信頼性予測
Title Transcription: デンシカイロキバンノリユースシンライセイヨソク
Author/Editor: 太田周一 [著]
Author Heading: 太田, 周一オオタ, シュウイチ
Publication, Distribution, etc.: [太田周一]
Publication Date: [2009]
Publication Date (W3CDTF): 2009
Extent: 1冊
Accompanying material: 要旨1枚
Degree grantor/type: 電気通信大学
Date Granted: 平成21年9月30日
Date Granted (W3CDTF): 2009
Dissertation Number: 甲第561号
Degree Type: 博士 (工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2009-P607
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010695631
http://id.ndl.go.jp/bib/000010695631
Bibliographic Record Category (NDL): 213