2009 IEEE AUTOTESTCON : Anaheim, California, USA : 14-17 September 2009. : IEEEAUTOTESTCON 2009 : Sep 2009, Anaheim, CA.

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Note (General)：: Program and papers."Welcome to the 45th edition of IEEE AUTOTESTCON!" -- conference chair message.IEEE cat no CFP09AUT-PRT.

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Material Type: 図書
ISBN: 9781424449804
ISSN: 1088-7725
Title: 2009 IEEE AUTOTESTCON : Anaheim, California, USA : 14-17 September 2009. : IEEEAUTOTESTCON 2009 : Sep 2009, Anaheim, CA.
Author Heading: Autotestcon 2009 (2009 : Anaheim, Calif.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2009.
Publication Date (W3CDTF): 2009
Extent: 456 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Automatic test equipment -- Congresses.
Maintainability (Engineering) -- Congresses.
Testing -- Data processing -- Congresses.
LCC: TK7895.A8
NDLC: M17
Note (General): Program and papers.
"Welcome to the 45th edition of IEEE AUTOTESTCON!" -- conference chair message.
IEEE cat no CFP09AUT-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-10-2101
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010696113
http://id.ndl.go.jp/bib/000010696113
OCLC No.: 586197918
https://www.worldcat.org/oclc/586197918
Bibliographic Record Category (NDL): 215