Electrical testing for open lead detection of logic ICs

Electrical testing for open lead detection of logic ICs

Call No. (NDL): UT51-2010-A431
Bibliographic ID of National Diet Library: 000010875687

Material type: 博士論文

Author: Akira Ono [著]

Publisher: [Akira Ono]

Publication date: [2010]

Material Format: Paper

Capacity, size, etc.: 1冊

Name of awarding university/degree: 徳島大学,博士 (工学)

Notes on use

Note (General)：: 博士論文

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Paper

Material Type: 博士論文
Title: Electrical testing for open lead detection of logic ICs
Author/Editor: Akira Ono [著]
Author Heading: 小野, 安季良オノ, アキラ
Publication, Distribution, etc.: [Akira Ono]
Publication Date: [2010]
Publication Date (W3CDTF): 2010
Extent: 1冊
Alternative Title: 論理ICのリード浮き検出のための電気的検査ロンリ IC ノリードウキケンシュツノタメノデンキテキケンサ
Degree grantor/type: 徳島大学
Date Granted: 平成22年3月23日
Date Granted (W3CDTF): 2010
Dissertation Number: 甲第2233号
Degree Type: 博士 (工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
Text Language Code: eng
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2010-A431
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010875687
http://id.ndl.go.jp/bib/000010875687
Bibliographic Record Category (NDL): 213