Optical metrology and inspection for industrial applications : 18-20 October 2010 : Beijing, China. : Oct 2010, Beijing, China. (SPIE Proceedings ; 7855)

Optical metrology and inspection for industrial applications : 18-20 October 2010 : Beijing, China. : Oct 2010, Beijing, China.

(SPIE Proceedings ; 7855)

Call No. (NDL): M17-11-997
Bibliographic ID of National Diet Library: 000011108870

Material type: 図書

Author: Beijing Institute of Technology.

Publisher: SPIE

Publication date: c2010.

Material Format: Paper

Capacity, size, etc.: 1 v. (various pagings) : ill. ; 28 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN: 9780819483850
ISSN (series): 0277-786X
Title: Optical metrology and inspection for industrial applications : 18-20 October 2010 : Beijing, China. : Oct 2010, Beijing, China.
Series Title: SPIE Proceedings ; 7855
Author Heading: Beijing Institute of Technology.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2010.
Publication Date (W3CDTF): 2010
Extent: 1 v. (various pagings) : ill. ; 28 cm.
Alternative Title: SPIE/COS photonics Asia
Place of Publication (Country Code): US
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-11-997
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011108870
http://id.ndl.go.jp/bib/000011108870
Bibliographic Record Category (NDL): 215