2008 IEEE second international conference on biometrics: theory, applications and systems : (BTAS) : Washington, DC, USA : 29 September-1 October 2008. : Sep 2008, Washington, DC.

Author: IEEE Conference on Biometrics: Theory, Applications, and Systems (2nd : 2008 : Arlington, Va.)

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Material Type: 図書
ISBN: 9781424427291
Title: 2008 IEEE second international conference on biometrics: theory, applications and systems : (BTAS) : Washington, DC, USA : 29 September-1 October 2008. : Sep 2008, Washington, DC.
Author Heading: IEEE Conference on Biometrics: Theory, Applications, and Systems (2nd : 2008 : Arlington, Va.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2008.
Publication Date (W3CDTF): 2008
Extent: 440 p. : ill. ; 27 cm.
Alternative Title: 2008 IEEE 2nd international conference on biometrics: theory, applications and systems : (BTAS) : Washington, DC, USA : 29 September-1 October 2008
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Biometric identification -- Congresses.
Pattern recognition systems -- Congresses.
Identification -- Automation -- Congresses.
LCC: TK7882.B56
NDLC: M17
Note (General): Papers and an abstract.
IEEE cat no CFP08BTA-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-11-3379
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011236070
http://id.ndl.go.jp/bib/000011236070
OCLC No.: 310102057
https://www.worldcat.org/oclc/310102057
Bibliographic Record Category (NDL): 215