2010 IEEE radiation effects data workshop : (REDW 2010) : Denver, California [i.e. Colorado] : 20-23 July 2010 : Jul 2010, Denver, CO.

• Material Type: 図書
• ISBN: 9781424484058
• ISSN: 21540519
• Title: 2010 IEEE radiation effects data workshop : (REDW 2010) : Denver, California [i.e. Colorado] : 20-23 July 2010 : Jul 2010, Denver, CO.
• Author Heading: IEEE Radiation Effects Data Workshop (2010 : Denver, Colo.); IEEE Nuclear and Space Radiation Effects Conference (2010 : Denver, Colo.)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2010.
• Publication Date (W3CDTF): 2010
• Extent: 192 p.
• Other physical details: ill.
• Size: 27 cm.
• Additional Title: 2010 IEEE radiation effects data workshop : (REDW 2010) : Denver, California [i.e. Colorado], USA : 20-23 July 2010.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Electronic apparatus and appliances--Effect of radiation on--Congresses.; Integrated circuits--Effect of radiation on--Congresses.; Metal oxide semiconductors, Complementary--Effect of radiation on--Congresses.
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.; IEEE cat no CFP10422-PRT.
• Note (Bibliography): Includes bibliographical references and indexes.
• Source: IEEE Xplore; http://ieeexplore.ieee.org/servlet/opac?punumber=5618479
• Holding library: 国立国会図書館
• Call No.: M17-12-344
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000011255138; http://id.ndl.go.jp/bib/000011255138
• OCLC No.: 742378555; https://www.worldcat.org/oclc/742378555
• Cataloging Rule: Anglo-American Cataloging Rules
• Bibliographic Record Category (NDL): 215