2010 East-West design & test symposium : (EWDTS 2010) : St. Petersburg, Russia : 17-20 September 2010 : IEEE East-West design & test international symposium : Sep 2010, St. Petersburg, Russia.

Author: IEEE East-West Design & Test Symposium (2010 : Saint Petersburg, Russia)

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Material Type: 図書
ISBN: 9781424495559
Title: 2010 East-West design & test symposium : (EWDTS 2010) : St. Petersburg, Russia : 17-20 September 2010 : IEEE East-West design & test international symposium : Sep 2010, St. Petersburg, Russia.
Author Heading: IEEE East-West Design & Test Symposium (2010 : Saint Petersburg, Russia)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2010.
Publication Date (W3CDTF): 2010
Extent: 571 p.
Other physical details: ill.
Size: 27 cm.
Additional Title: 2010 East-West design and test symposium : (EWDTS 2010) : St. Petersburg, Russia : 17-20 September 2010.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Electronics--Testing--Congresses.
LCC: TK7801
NDLC: M17
Target Audience: 一般
Note (General): Papers.
IEEE cat no CFP10DTW-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Source: IEEE Xplore
http://ieeexplore.ieee.org/servlet/opac?punumber=5738234
Holding library: 国立国会図書館
Call No.: M17-12-1292
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011295495
http://id.ndl.go.jp/bib/000011295495
OCLC No.: 727065593
https://www.worldcat.org/oclc/727065593
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215