Atomic scale characterization and first-principles studies of Si₃N₄ interfaces (Springer theses : recognizing outstanding Ph. D. research)

Atomic scale characterization and first-principles studies of Si₃N₄ interfaces

(Springer theses : recognizing outstanding Ph. D. research)

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Material Type: 図書
ISBN: 9781441978165
144197816X
ISSN (series): 2190-5053
Title: Atomic scale characterization and first-principles studies of Si₃N₄ interfaces
Author/Editor: Weronika Walkosz.
Series Title: Springer theses : recognizing outstanding Ph. D. research
Author Heading: Walkosz, Weronika.
Publication, Distribution, etc.: New York : Springer
Publication Date: c2011.
Publication Date (W3CDTF): 2011
Extent: xiii, 108 p.
Other physical details: ill.
Size: 25 cm.
Place of Publication (Country Code): US
Text Language Code: eng
LCC: TA
NDLC: PA235
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: PA235-B11
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011295989
http://id.ndl.go.jp/bib/000011295989
OCLC No.: 668191391
https://www.worldcat.org/oclc/668191391
Bibliographic Record Category (NDL): 211