Trap level spectroscopy in amorphous semiconductors

• Material Type: 図書
• ISBN: 9780123847157 (hbk.); 012384715X (hbk.)
• Title: Trap level spectroscopy in amorphous semiconductors
• Author/Editor: Victor I. Mikla and Victor V. Mikla.
• Edition: 1st ed.
• Series Title: Elsevier insights
• Title Heading: Elsevier insights.
• Author Heading: Mikla, Victor I.; Mikla, Victor V.
• Publication, Distribution, etc.: Amsterdam : Elsevier; Boston : Elsevier
• Publication Date: 2010.
• Publication Date (W3CDTF): 2010
• Extent: vi, 120 p.
• Other physical details: ill.
• Size: 24 cm.
• Place of Publication (Country Code): NL
• Text Language Code: eng
• Subject Heading: Amorphous semiconductors--Spectra.; Amorphous semiconductors--Defects--Analysis.; Deep level transient spectroscopy.
• LCC: QC611.8.A5
• DDC: 537.6223
• NDLC: MC151
• Target Audience: 一般
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: MC151-B37
• Has Format (URI): http://www.sciencedirect.com/science/book/9780123847157
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000011298563; http://id.ndl.go.jp/bib/000011298563
• OCLC No.: 567148516; https://www.worldcat.org/oclc/567148516
• Bibliographic Record Category (NDL): 211

• Contents: Defect states spectroscopy in amorphous semiconductorsThermally stimulated depolarziation currents in amorphous chalcogenidesCarrier transport process...