29th VLSI test symposium : (VTS 2011) : Dana Point, California, USA : 1-5 May 2011 : 2011 29th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meeting : May 2011, Dana Point, CA.

29th VLSI test symposium : (VTS 2011) : Dana Point, California, USA : 1-5 May 2011 : 2011 29th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meeting : May 2011, Dana Point, CA.

Call No. (NDL): M17-12-2224
Bibliographic ID of National Diet Library: 023392796

Material type: 図書

Author: IEEE VLSI Test Symposium (29th : 2011 : Dana Point, Calif.)

Publisher: IEEE

Publication date: c2011.

Material Format: Paper

Capacity, size, etc.: xxvii, 328 p. ; 27 cm.

NDC: -

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Notes on use

Note (General)：: Papers and abstracts."Welcome to VTS 2011, the twenty-ninth in a series of annual symposia (...)" -- foreword."This year, the Workshop on Design for R...

Other physical details：: ill.

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Paper

Material Type: 図書
ISBN: 9781612846576
ISSN: 10930167
Title: 29th VLSI test symposium : (VTS 2011) : Dana Point, California, USA : 1-5 May 2011 : 2011 29th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meeting : May 2011, Dana Point, CA.
Author Heading: IEEE VLSI Test Symposium (29th : 2011 : Dana Point, Calif.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2011.
Publication Date (W3CDTF): 2011
Extent: xxvii, 328 p.
Other physical details: ill.
Size: 27 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits--Very large scale integration--Testing--Congresses.
LCC: TK7874.75
NDLC: M17
Target Audience: 一般
Note (General): Papers and abstracts.
"Welcome to VTS 2011, the twenty-ninth in a series of annual symposia (...)" -- foreword.
"This year, the Workshop on Design for Reliability and Variability (DRV 2011) will take place in conjunction with VTS." -- foreword.
"Two tutorials are offered by (...)" -- foreword.
IEEE cat no CFP11029-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Source: http://ieeexplore.ieee.org/servlet/opac?punumber=5772241
Holding library: 国立国会図書館
Call No.: M17-12-2224
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 023392796
http://id.ndl.go.jp/bib/023392796
OCLC No.: 780454103
https://www.worldcat.org/oclc/780454103
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215