図書

2011 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2011) : Vancouver, British Columbia, Canada : 3-5 October 2011 : DFT 2011 conference : DFTS conferences : Oct 2011, Vancouver, Canada.

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2011 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2011) : Vancouver, British Columbia, Canada : 3-5 October 2011 : DFT 2011 conference : DFTS conferences : Oct 2011, Vancouver, Canada.

Call No. (NDL)
M17-12-2868
Bibliographic ID of National Diet Library
023553089
Material type
図書
Author
Chapman, Glenn.
Publisher
IEEE
Publication date
c2011.
Material Format
Paper
Capacity, size, etc.
xvii, 482 p. ; 27 cm.
NDC
-
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Notes on use

Note (General)：

Abstracts and papers."(...) (DFT 2011) (...) This is the 24th gathering (...)" -- p. xi.IEEE cat no CFP11078-PRT.

Other physical details：

ill. (some col.)

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Paper

Material Type
図書
ISBN
9781457717130
ISSN
15505774
Title
2011 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2011) : Vancouver, British Columbia, Canada : 3-5 October 2011 : DFT 2011 conference : DFTS conferences : Oct 2011, Vancouver, Canada.
Author Heading
Chapman, Glenn.
Publication, Distribution, etc.
Piscataway : IEEE
Publication Date
c2011.
Publication Date (W3CDTF)
2011
Extent
xvii, 482 p.
Other physical details
ill. (some col.)