2010 5th international design and test workshop : (IDT 2010) : Abu Dhabi, United Arab Emirates : 14-15 December 2010 : Dec 2010, Abu Dhabi, United Arab Emirates.

Author: International Design and Test Workshop (5th : 2010 : Abū Ẓaby, United Arab Emirates)ほか

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Material Type: 図書
ISBN: 9781612842912
Title: 2010 5th international design and test workshop : (IDT 2010) : Abu Dhabi, United Arab Emirates : 14-15 December 2010 : Dec 2010, Abu Dhabi, United Arab Emirates.
Author Heading: International Design and Test Workshop (5th : 2010 : Abū Ẓaby, United Arab Emirates)
Zorian, Yervant.
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2010.
Publication Date (W3CDTF): 2010
Extent: xiv, 173 p.
Other physical details: ill.
Size: 27 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits--Design and construction--Congresses.
Integrated circuits--Testing--Congresses.
Semiconductor storage devices--Congresses.
LCC: TK7874
NDLC: M17
Target Audience: 一般
Note (General): Papers and program.
IEEE cat no CFP1063D-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Source: IEEE Xplore
http://ieeexplore.ieee.org/servlet/opac?punumber=5720574
Holding library: 国立国会図書館
Call No.: M17-12-3252
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 023595400
http://id.ndl.go.jp/bib/023595400
OCLC No.: 731213140
https://www.worldcat.org/oclc/731213140
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215