Interferometry 16: techniques and analysis : 13-15 August 2012 : San Diego, California, United States : 16th interferometry conference : conference on interferometric techniques and analysis : SPIE 57th annual meeting : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8493)

Interferometry 16: techniques and analysis : 13-15 August 2012 : San Diego, California, United States : 16th interferometry conference : conference on interferometric techniques and analysis : SPIE 57th annual meeting : Aug 2012, San Diego, CA.

(SPIE Proceedings ; 8493)

Call No. (NDL): M17-13-975
Bibliographic ID of National Diet Library: 024012301

Material type: 図書

Author: Schmit, Joanna.

Publisher: SPIE

Publication date: c2012.

Material Format: Paper

Capacity, size, etc.: 1 v. (various pagings) ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Papers."Interferometry XVI (...) consists of two complementary conferences, one dedicated to Techniques and Analysis and the other to Applications." -...

Other physical details：: ill.

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Paper

Material Type: 図書
ISBN: 9780819492104
ISSN (series): 0277786X
ISSN (error code): 0277786786X
Title: Interferometry 16: techniques and analysis : 13-15 August 2012 : San Diego, California, United States : 16th interferometry conference : conference on interferometric techniques and analysis : SPIE 57th annual meeting : Aug 2012, San Diego, CA.
Series Title: SPIE Proceedings ; 8493
Title Heading: SPIE digital library.
Proceedings of SPIE -- the International Society for Optical Engineering ; v. 8493. 0277-786X
Author Heading: Schmit, Joanna.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2012.
Publication Date (W3CDTF): 2012
Extent: 1 v. (various pagings)
Other physical details: ill.
Size: 28 cm.
Additional Title: SPIE optics + photonics.
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Electronic books.
Subject Heading: Interferometry--Industrial applications--Congresses.
Measurement--Congresses.
Metrology--Congresses.
LCC: QC410.9
NDLC: M17
Target Audience: 一般
Note (General): Papers.
"Interferometry XVI (...) consists of two complementary conferences, one dedicated to Techniques and Analysis and the other to Applications." -- introd.
"It contains 47 papers presented at the SPIE 57th Annual Meeting in San Diego on August 12-16, 2012." -- introd.
Note (Bibliography): Includes bibliographical references and author index.
Source: http://proceedings.spiedigitallibrary.org/volume.aspx?volumeid=14784
http://link.spie.org/PSISDG/8493/1
Holding library: 国立国会図書館
Call No.: M17-13-975
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024012301
http://id.ndl.go.jp/bib/024012301
OCLC No.: 817901040
https://www.worldcat.org/oclc/817901040
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215