X-ray free-electron lasers: beam diagnostics, beamline instrumentation, and applications : 13-16 August 2012 : San Diego, California, United States : conference x-ray free-electron lasers: beam diagnostics, beamline instrumentation, and applications : Aug 2012, San Diego, CA.

• Material Type: 図書
• ISBN: 9780819492210 (pbk.)
• ISSN (series): 0277786X
• ISSN (error code): 0277786786X
• Title: X-ray free-electron lasers: beam diagnostics, beamline instrumentation, and applications : 13-16 August 2012 : San Diego, California, United States : conference x-ray free-electron lasers: beam diagnostics, beamline instrumentation, and applications : Aug 2012, San Diego, CA.
• Series Title: SPIE Proceedings ; 8504
• Title Heading: SPIE digital library.; Proceedings of SPIE -- the International Society for Optical Engineering ; v. 8504. 0277-786X
• Author Heading: Moeller, Stefan P.; Yabashi, Makina; Hau-Riege, Stefan P.
• Publication, Distribution, etc.: Bellingham : SPIE
• Publication Date: c2012.
• Publication Date (W3CDTF): 2012
• Extent: 1 v. (various pagings)
• Other physical details: ill.
• Size: 28 cm.
• Additional Title: SPIE optics + photonics.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Electronic books.
• Subject Heading: Free electron lasers--Congresses.; Laser beams--Congresses.; Beam optics--Congresses.; X-ray lasers--Congresses.
• LCC: TA1693
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.
• Note (Bibliography): Includes bibliographical references and author index.
• Source: http://link.spie.org/PSISDG/8504/1; http://proceedings.spiedigitallibrary.org/volume.aspx?volumeid=14880
• Holding library: 国立国会図書館
• Call No.: M17-13-1054
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 024079595; http://id.ndl.go.jp/bib/024079595
• OCLC No.: 817939727; https://www.worldcat.org/oclc/817939727
• Cataloging Rule: Anglo-American Cataloging Rules
• Bibliographic Record Category (NDL): 215