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Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors 6 : 13-14 August 2012 : San Diego, California, United States : instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors 6 (conference 8466) : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8466)

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Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors 6 : 13-14 August 2012 : San Diego, California, United States : instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors 6 (conference 8466) : Aug 2012, San Diego, CA.

(SPIE Proceedings ; 8466)

Call No. (NDL)
M17-13-1425
Bibliographic ID of National Diet Library
024129165
Material type
図書
Author
Postek, Michael T.ほか
Publisher
SPIE
Publication date
c2012.
Material Format
Paper
Capacity, size, etc.
1 v. (various pagings) ; 28 cm.
NDC
-
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Paper

Material Type
図書
ISBN
9780819491831
ISSN (series)
0277786X
ISSN (error code)
0277786786X
Publication, Distribution, etc.
Publication Date
c2012.