2012 19th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2012) : Singapore : 2-6 July 2012 : Jul 2012, Singapore.

• Material Type: 図書
• ISBN: 9781467309806 (print)
• ISSN: 19461542
• Title: 2012 19th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2012) : Singapore : 2-6 July 2012 : Jul 2012, Singapore.
• Author Heading: International Symposium on the Physical & Failure Analysis of Integrated Circuits (19th : 2012 : Singapore)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2012.
• Publication Date (W3CDTF): 2012
• Extent: 408 p.
• Other physical details: ill.
• Size: 27 cm.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits--Reliability--Congresses.; Integrated circuits--Testing--Congresses.; Semiconductors--Failures--Congresses.; Integrated circuits--Defects--Congresses.
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.; IEEE cat no CFP12777-PRT.
• Note (Bibliography): Includes bibliographical references and author index.
• Source: IEEE Xplore; http://ieeexplore.ieee.org/servlet/opac?punumber=6296434
• Holding library: 国立国会図書館
• Call No.: M17-13-1384
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 024151070; http://id.ndl.go.jp/bib/024151070
• OCLC No.: 817932431; https://www.worldcat.org/oclc/817932431
• Cataloging Rule: Anglo-American Cataloging Rules
• Bibliographic Record Category (NDL): 215