2012 IEEE 18th international on-line testing symposium : (IOLTS 2012) : Sitges, Spain : 27-29 June 2012 : Jun 2012, Sitges, Spain. CFP120LT-CDR

2012 IEEE 18th international on-line testing symposium : (IOLTS 2012) : Sitges, Spain : 27-29 June 2012 : Jun 2012, Sitges, Spain.

Author: IEEE International On-Line Testing Symposium (18th : 2012 : Sitges, Spain)ほか

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Material Type: 図書
ISBN: 9781467320825
Title: 2012 IEEE 18th international on-line testing symposium : (IOLTS 2012) : Sitges, Spain : 27-29 June 2012 : Jun 2012, Sitges, Spain.
Author Heading: IEEE International On-Line Testing Symposium (18th : 2012 : Sitges, Spain)
Universitat Politecnica de Catalunya.
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2012.
Publication Date (W3CDTF): 2012
Extent: xx, 193 p.
Other physical details: ill.
Size: 27 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Error-correcting codes (Information theory)--Congresses.
Electronic circuit design--Congresses.
Online data processing--Congresses.
Electronic circuits--Testing--Congresses.
LCC: TK7867
NDLC: M17
Target Audience: 一般
Note (General): Abstracts and papers.
IEEE cat no CFP12OLT-PRT.
Note (Bibliography): Includes bibliographical references.
Report No.: CFP120LT-CDR
Source: IEEE Xplore
http://ieeexplore.ieee.org/servlet/opac?punumber=6304844
Holding library: 国立国会図書館
Call No.: M17-13-1472
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024180763
http://id.ndl.go.jp/bib/024180763
OCLC No.: 835621756
https://www.worldcat.org/oclc/835621756
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215