半導体部品の信頼性 : 高信頼化の歴史とフィールドデータ

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Material Type: 図書
ISBN: 978-4-86345-172-8
Title: 半導体部品の信頼性 : 高信頼化の歴史とフィールドデータ
Title Transcription: ハンドウタイブヒンノシンライセイ : コウシンライカノレキシトフィールドデータ
Author/Editor: 荒井英輔, 塩野登編著
Author Heading: 荒井, 英輔, 1942- アライ, エイスケ, 1942- ( 00693719 )Authorities
塩野, 登シオノ, ノボル ( 01212843 )Authorities
Publication, Distribution, etc.: 東京 : 丸善プラネット
東京 : 丸善出版 (発売)
Publication Date: 2013.8
Publication Date (W3CDTF): 2013
Extent: 344p
Size: 30cm
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: 半導体--品質管理ハンドウタイヒンシツカンリ ( 00908759 )Authorities
NDC 9th ed.: 549.8 : Electronic engineering
NDLC: ND371
Target Audience: 一般
Note (General): 執筆: 岩根眼藏ほか
Note (Bibliography): 文献あり
Price: 8000円
Holding library: 国立国会図書館
Call No.: ND371-L17
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 024746266
http://id.ndl.go.jp/bib/024746266
National Bibliography No. (JPNO): 22293777
Cataloging Rule: Nippon Cataloguing Rules 1987 Revised Edition
Bibliographic Record Category (NDL): 111