LCTES'13 : proceedings of the 2013 ACM SIGPLAN/SIGBED conference on languages, compilers and tools for embedded systems : June 20-21, 2013 : Seattle, Washington, USA.

Call No. (NDL): M17-14-2166
Bibliographic ID of National Diet Library: 025324787

Material type: 図書

Author: ACM SIGPLAN/SIGBED Conference on Languages, Compilers, and Tools for Embedded Systems (14th : 2013 : Seattle, Wash.)

Publisher: Association for Computing Machinery

Publication date: c2013.

Material Format: Paper

Capacity, size, etc.: ix, 173 p. ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Papers.

Other physical details：: ill.

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Paper

Material Type: 図書
ISBN: 9781450320856
Title: LCTES'13 : proceedings of the 2013 ACM SIGPLAN/SIGBED conference on languages, compilers and tools for embedded systems : June 20-21, 2013 : Seattle, Washington, USA.
Author Heading: ACM SIGPLAN/SIGBED Conference on Languages, Compilers, and Tools for Embedded Systems (14th : 2013 : Seattle, Wash.)
Publication, Distribution, etc.: New York : Association for Computing Machinery
Publication Date: c2013.
Publication Date (W3CDTF): 2013
Extent: ix, 173 p.
Other physical details: ill.
Size: 28 cm.
Additional Title: 14th ACM SIGPLAN/SIGBED conference on languages, compilers, tools and theory for embedded systems : LCTES : Jun 2013, Seattle, WA.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Fault-tolerant computing--Congresses.
Computer programs--Testing--Congresses.
Embedded computer systems--Programming--Congresses.
Computer science.
LCC: TK7895.E42
NDLC: M17
Target Audience: 一般
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Source: Full text available from ACM Digital Library （Connect to full text.）
http://dl.acm.org/citation.cfm?id=2491899
Holding library: 国立国会図書館
Call No.: M17-14-2166
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 025324787
http://id.ndl.go.jp/bib/025324787
Cataloging Rule: Anglo-American Cataloging Rules
Bibliographic Record Category (NDL): 215

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