Low-voltage electron microscopy and spectroscopy for materials characterization : November 25-30, 2012 : Boston, Massachusetts, USA : Nov 2012, Boston, MA.

• Material Type: 図書
• ISBN: 1632661217; 9781632661210
• Title: Low-voltage electron microscopy and spectroscopy for materials characterization : November 25-30, 2012 : Boston, Massachusetts, USA : Nov 2012, Boston, MA.
• Series Title: Materials Research Society Symposia Proceedings ; 1531
• Title Heading: Materials Research Society symposia proceedings ; v. 1531.
• Author Heading: Symposium YY: Low-Voltage Electron Microscopy and Spectroscopy for Materials Characterization (2012 : Boston, Mass.); Egerton, R. (Ray)
• Publication, Distribution, etc.: Cambridge, United Kingdom : Cambridge University Press (出版); Warrendale, PA : Materials Research Society (出版); Red Hook, NY : Curran Associates, Inc. (製作)
• Publication Date: [2013]; 著作権日付 : ©2013
• Publication Date (W3CDTF): 2013
• Extent: 12 pages
• Other physical details: illustrations
• Size: 24 cm.
• Alternative Title: 2012 MRS fall meeting
• Place of Publication (Country Code): GB
• Text Language Code: eng
• Genre/Form Terms: Conference proceedings.
• Content Type: txt : text
• Media Type: n : unmediated
• Carrier Type: nc : volume
• Subject Heading: Materials--Microscopy--Congresses.; Materials--Microscopy.
• LCC: TA417.23
• DDC: 620.1127
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-14-2459
• Has Format (URI): http://journals.cambridge.org/action/displayIssue?jid=OPL&volumeId=1531
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 025403967; http://id.ndl.go.jp/bib/025403967
• OCLC No.: 876802792; https://www.worldcat.org/oclc/876802792
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215