2014 15th international symposium on quality electronic design : (ISQED 2014) : Santa Clara, California, USA : 3-5 March 2014 : 15th int'l symposium on quality electronic design : ISQED 2014 conference : ISQED tutorials : ISQED events : Mar 2014, Santa Clara, CA.

2014 15th international symposium on quality electronic design : (ISQED 2014) : Santa Clara, California, USA : 3-5 March 2014 : 15th int'l symposium on quality electronic design : ISQED 2014 conference : ISQED tutorials : ISQED events : Mar 2014, Santa Clara, CA.

Call No. (NDL): M17-15-2495
Bibliographic ID of National Diet Library: 026296839

Material type: 図書

Author: International Symposium on Quality Electronic Design (15th : 2014 : Santa Clara, Calif.)

Publisher: IEEE

Publication date: [2014]

Material Format: Paper

Capacity, size, etc.: v, 775 pages ; 28 cm

NDC: -

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Notes on use

Note (General)：: Abstracts, program and papers.Described as "The two-day technical program with three parallel sessions pack ..."--Page iii.IEEE catalog number CFP1425...

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781479939473 (print)
1479939471 (print)
Title: 2014 15th international symposium on quality electronic design : (ISQED 2014) : Santa Clara, California, USA : 3-5 March 2014 : 15th int'l symposium on quality electronic design : ISQED 2014 conference : ISQED tutorials : ISQED events : Mar 2014, Santa Clara, CA.
Author Heading: International Symposium on Quality Electronic Design (15th : 2014 : Santa Clara, Calif.)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2014
Extent: v, 775 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Integrated circuits--Very large scale integration--Design and construction--Congresses.
Integrated circuits--Very large scale integration--Computer-aided design--Congresses.
Three-dimensional integrated circuits--Congresses.
Integrated circuits industry--Quality control--Congresses.
Integrated circuits industry--Quality control.
Integrated circuits--Very large scale integration--Computer-aided design.
Integrated circuits--Very large scale integration--Design and construction.
Three-dimensional integrated circuits.
LCC: TK7874.75
NDLC: M17
Target Audience: 一般
Note (General): Abstracts, program and papers.
Described as "The two-day technical program with three parallel sessions pack ..."--Page iii.
IEEE catalog number CFP14250-POD.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-15-2495
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 026296839
http://id.ndl.go.jp/bib/026296839
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215