2014 IEEE 23rd North Atlantic test workshop : (NATW 2014) : Johnson City, New York, USA : 14-16 May 2014 : May 2014, Johnson City, NY.

• Material Type: 図書
• ISBN: 9781479951369; 1479951366
• Title: 2014 IEEE 23rd North Atlantic test workshop : (NATW 2014) : Johnson City, New York, USA : 14-16 May 2014 : May 2014, Johnson City, NY.
• Author Heading: IEEE North Atlantic Test Workshop (23rd : 2014 : Binghamton, N.Y.)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2014]; 著作権日付 : ©2014
• Publication Date (W3CDTF): 2014
• Extent: xii, 79 pages
• Other physical details: illustrations
• Size: 27 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Embedded computer systems--Congresses.; Random access memory--Congresses.; Systems on a chip--Testing--Congresses.; Integrated circuits--Testing--Congresses.
• LCC: TK7895.E42
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.; Described as "IEEE 23rd North Atlantic Test Workshop : Proceedings : 14-16 May 2014 : Binghampton, New York"--Added title page.; IEEE catalog number CFP14NAT-POD.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-15-2207
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 026354947; http://id.ndl.go.jp/bib/026354947
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215