檢驗錯誤影響下之計數值單次與双次抽樣計劃之設計

Notes on use

Note (General)：: 英文標題紙タイトル: The design of attribute single and double sampling plans under inspection error折り込 5枚

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Material Type: 図書
Title: 檢驗錯誤影響下之計數值單次與双次抽樣計劃之設計
Author/Editor: 陳志祥 [著]
Publication, Distribution, etc.: [出版地不明] : 國立交通大學管理學院管理科學硏究所
Publication Date: 1984.6
Publication Date (W3CDTF): 1984
Extent: 2, 116枚
Size: 26cm
Place of Publication (Country Code): TW
Text Language Code: chi
NDLC: DH371
Target Audience: 一般
Note (General): 英文標題紙タイトル: The design of attribute single and double sampling plans under inspection error
折り込 5枚
Note (Bibliography): 文献あり
Holding library: 国立国会図書館
Call No.: DH371-161
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 027377191
http://id.ndl.go.jp/bib/027377191
Cataloging Rule: Nippon Cataloguing Rules 1987 Revised Edition
Bibliographic Record Category (NDL): 511