2014 IEEE 23rd Asian test symposium : (ATS 2014) : Hangzhou, China : 16-19 November 2014 : Nov 2014, Hangzhou, China.

• Material Type: 図書
• ISBN: 9781479960316 (print)
• Title: 2014 IEEE 23rd Asian test symposium : (ATS 2014) : Hangzhou, China : 16-19 November 2014 : Nov 2014, Hangzhou, China.
• Author Heading: Asian Test Symposium (23rd : 2014 : Hangzhou, China)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2014]; 著作権日付 : ©2014
• Publication Date (W3CDTF): 2014
• Extent: xxii, 360 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Electronic digital computers--Circuits--Testing--Congresses.; Electronic circuits--Testing--Congresses.; Fault-tolerant computing--Congresses.; Electronic circuits--Testing.; Electronic digital computers--Circuits--Testing.; Fault-tolerant computing.
• LCC: TK7888.4
• NDLC: M17
• Target Audience: 一般
• Note (General): Abstracts and papers.; "Welcome to the IEEE Asian Test Symposium, the twenty-third in a series of annual symposia on ..."--Page xii.; IEEE catalog number CFP14067-POD.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-16-2089
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 027454263; http://id.ndl.go.jp/bib/027454263
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215