Technoscience and postphenomenology : the Manhattan papers

• Material Type: 図書
• ISBN: 9780739189610 (hardcover); 0739189611 (hardcover)
• ISBN (error code): 9780739189627 (ebk.)
• Title: Technoscience and postphenomenology : the Manhattan papers
• Author/Editor: edited by Jan Kyrre Berg O. Friis and Robert P. Crease.
• Series Title: Postphenomenology and the philosophy of technology
• Title Heading: Postphenomenology and the philosophy of technology.
• Author Heading: Friis, Jan Kyrre Berg Olsen, 1963-; Crease, Robert P ( 00465057 )Authorities
• Publication, Distribution, etc.: Lanham : Lexington Books (出版)
• Publication Date: [2015]
• Publication Date (W3CDTF): 2015
• Extent: xix, 259 pages
• Other physical details: illustrations
• Size: 24 cm.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Ihde, Don, 1934-; Technology--Philosophy--Congresses.; Phenomenology--Congresses.; Postmodernism--Congresses.; Postmodernism 2sao.; Phenomenology.; Postmodernism.; Technology--Philosophy.; Teknik--teori, filosofi.; Fenomenologi.
• LCC: T14
• DDC: 601
• NDLC: M22
• Target Audience: 一般
• Note (General): "These papers originated at the "Ihdefest", a conference held in Manhattan on March 22-23, 2012, to celebrate the impending retirement of the field's founder."--Introduction.
• Note (Bibliography): Includes bibliographical references and index.
• Collection (particular): 日本関係外国語図書
• Holding library: 国立国会図書館
• Call No.: M22-B46
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 027633135; http://id.ndl.go.jp/bib/027633135
• OCLC No.: 934680126; https://www.worldcat.org/oclc/934680126
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 211

• Contents: Foreword: Is there a bat problem for postphenomenology? / Don IhdeIntroductionPostphenomenology's North American Future / Robert C. Scharff...
• Summary, etc.: " ... Friis and Robert P. Crease capture postphenomenology, a new field that has attracted attention among scholars engaged in technology studies. Con...