2015 IEEE international integrated reliability workshop : (IIRW 2015) : South Lake Tahoe, California, USA : 11-15 October 2015 : Oct 2015, South Lake Tahoe, CA.

• Material Type: 図書
• ISBN: 9781467373975 (Print-On-Demand)
• ISSN: 1930-8841
• Title: 2015 IEEE international integrated reliability workshop : (IIRW 2015) : South Lake Tahoe, California, USA : 11-15 October 2015 : Oct 2015, South Lake Tahoe, CA.
• Author Heading: International Integrated Reliability Workshop (2015 : South Lake Tahoe, Calif.)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2015]; 著作権日付 : ©2015
• Publication Date (W3CDTF): 2015
• Extent: ix, 183 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Integrated circuits--Reliability--Congresses.; Integrated circuits--Wafer-scale integration--Reliability--Congresses.; Semiconductors--Reliability--Congresses.; Integrated circuits--Reliability.; Integrated circuits--Wafer-scale integration--Reliability.; Semiconductors--Reliability.
• NDLC: M17
• Target Audience: 一般
• Note (General): Abstracts, papers and presentations.; IEEE catalog number CFP15IRW-POD.
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: M17-17-1155
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 027637979; http://id.ndl.go.jp/bib/027637979
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215