図書

National Semiconductor Metrology Program. March 1997 (NIST list of publications ; LP 103)

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National Semiconductor Metrology Program. March 1997

(NIST list of publications ; LP 103)

Call No. (NDL)
Y622-B50
Bibliographic ID of National Diet Library
027658030
Material type
図書
Author
Semiconductor Electronics Divisionほか
Publisher
U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology
Publication date
[1997]
Material Format
Paper
Capacity, size, etc.
i, 112 pages ; 28 cm.
NDC
-
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Notes on use

Note (General)：

Cover title."Publications for the years 1990-1996"--Page i.

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Paper

Material Type
図書
Title
National Semiconductor Metrology Program.
Volume
March 1997
Author/Editor
Semiconductor Electronics Division
Jane Walters, editor.
Series Title
NIST list of publications ; LP 103
Author Heading
National Semiconductor Metrology Program (U.S.)
National Institute of Standards and Technology (U.S.)
National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs.
Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology)
Publication, Distribution, etc.
Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology (出版)
Publication Date
[1997]
Publication Date (W3CDTF)
1997
Extent
i, 112 pages