2015 IEEE Far East NDT new technology & application forum : (FENDT 2015) : Zhuhai, China : 28-31 May 2015 : 2015 IEEE Far East forum on nondestructive evaluation/testing: new technology & application : FENDT conference : May 2015, Zhuhai, China.

• Material Type: 図書
• ISBN: 9781467370028 (Print-On-Demand)
• Title: 2015 IEEE Far East NDT new technology & application forum : (FENDT 2015) : Zhuhai, China : 28-31 May 2015 : 2015 IEEE Far East forum on nondestructive evaluation/testing: new technology & application : FENDT conference : May 2015, Zhuhai, China.
• Author Heading: Far East Forum on Nondestructive Evaluation/Testing (12th : 2015 : Zhuhai, China)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2015]; 著作権日付 : ©2015
• Publication Date (W3CDTF): 2015
• Extent: 5, 281, 3 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Nondestructive testing--Technological innovations--Congresses.
• LCC: TA417.2
• NDLC: M17
• Target Audience: 一般
• Note (Target Audience): Scholarly & Professional
• Note (General): Papers.; IEEE catalog number CFP1510U-POD.
• Note (Content): The 12th FENDT (2015) will be held in Zhuhai, Guangdong province on May 28-31, 2015. Aiming at strengthening academic communication and promoting the innovation development of nondestructive testing, the International Far East Forum on Nondestructive Evaluation Testing (FENDT) has become the most important event for Nondestructive Evaluation Testing in China since its inception in Nangjing, 2004. The forum assembles all the professionals such as leading researchers, engineers, scientists, industrial people and students worldwide under one roof every year It is a great platform for sharing experiences, innovative ideas, industrial progresses and research results in the field of Ultrasonic Evaluation Testing, Magnetic particle Testing, Radiographic Testing and Eddy current Testing, NDT Image Processing Technology, Infrared, Laser and Microwave Detection Technology etc. The conference also provides a showcase platform for companies to exhibit their latest technology and products.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-17-1462
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 027662716; http://id.ndl.go.jp/bib/027662716
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215