VLSI-SoC: design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE international conference on very large scale integration, VLSI-SoC 2015 : Daejeon, Korea, October 5-7, 2015 : revised selected papers.

• Material Type: 図書
• ISBN: 9783319460963 (print)
• ISSN (series): 1868-4238
• Title: VLSI-SoC: design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE international conference on very large scale integration, VLSI-SoC 2015 : Daejeon, Korea, October 5-7, 2015 : revised selected papers.
• Series Title: IFIP Advances in Information and Communication Technology ; 483
• Title Heading: IFIP advances in information and communication technology ; 483. 1868-4238
• Author Heading: International Conference on Very Large Scale Integration (23rd : 2015 : Taejŏn-si, Korea); Shin, Youngsoo.; Tsui, Chi-Ying.; Kim, Jae-Joon.; Choi, Kiyoung.; Reis, Ricardo.
• Publication, Distribution, etc.: Switzerland : Springer (出版)
• Publication Date: 2016.
• Publication Date (W3CDTF): 2016
• Extent: xii, 221 pages
• Other physical details: illustrations
• Size: 25 cm.
• Additional Title: 23rd IFIP/IEEE WG10.5 international conference on very large scale integration : IFIP/IEEE international conference on very large scale integration-system-on-chip (VLSI-SoC) 2015 : Oct 2015, Daejeon, Korea.
• Place of Publication (Country Code): CH
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Internet of things--Congresses.; Integrated circuits--Very large scale integration--Congresses.; Integrated circuits--Very large scale integration.; Internet of things.
• LCC: QA76.9.C643
• DDC: 004.6
• NDLC: M17
• Target Audience: 一般
• Note (General): Revised selected papers.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-17-1582
• Related Material (DOI): 10.1007/978-3-319-46097-0
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 027682064; http://id.ndl.go.jp/bib/027682064
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215

• Summary, etc.: This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Sca...