2015 IEEE 24th Asian test symposium (ATS 2015) : Mumbai, India : 22-25 November 2015 : Nov 2015, Mumbai, India.

• Material Type: 図書
• ISBN: 9781467397407 (Print-On-Demand)
• ISSN: 1081-7735
• Title: 2015 IEEE 24th Asian test symposium (ATS 2015) : Mumbai, India : 22-25 November 2015 : Nov 2015, Mumbai, India.
• Author Heading: Asian Test Symposium (24th : 2015 : Mumbai, India)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2015]; 著作権日付 : ©2015
• Publication Date (W3CDTF): 2015
• Extent: xii, 216 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Electronic digital computers--Circuits--Testing--Congresses.; Electronic circuits--Testing--Congresses.; Fault-tolerant computing--Congresses.; Electronic circuits--Testing.; Electronic digital computers--Circuits--Testing.; Fault-tolerant computing.
• LCC: TK7888.4
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.; IEEE catalog number CFP15067-POD.
• Note (Bibliography): Includes bibliographical references.
• Holding library: 国立国会図書館
• Call No.: M17-17-2044
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 027830537; http://id.ndl.go.jp/bib/027830537
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215