2015 19th international symposium on VLSI design and test : (VDAT 2015) : Ahmedabad, India : 26-29 June 2015 : VDAT-2015 : Jun 2015, Ahmedabad, India.

• Material Type: 図書
• ISBN: 9781479917440 (print)
• Title: 2015 19th international symposium on VLSI design and test : (VDAT 2015) : Ahmedabad, India : 26-29 June 2015 : VDAT-2015 : Jun 2015, Ahmedabad, India.
• Author Heading: VDAT (Symposium) (19th : 2015 : Ahmadābād, India); Nirma University of Science and Technology (Ahmedabad, India). Institute of Technology.; VLSI Society of India (VSI)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2015]
• Publication Date (W3CDTF): 2015
• Extent: xix, 537 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Integrated circuits--Very large scale integration--Testing--Congresses.; Integrated circuits--Very large scale integration--Design and construction--Congresses.; Integrated circuits--Very large scale integration--Design and construction.; Integrated circuits--Very large scale integration--Testing.
• LCC: TK7874
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers and abstracts.; "... We are very proud to note that the VLSI Society of India is contributing towards facilitating the generation of ideas and thrusting research by holding International Symposium on VLSI Design and Test every year."--Page v.; IEEE catalog number CFP1572Y-POD.
• Note (Bibliography): Includes bibliographical references and indexes.
• Holding library: 国立国会図書館
• Call No.: M17-17-2065
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 027833504; http://id.ndl.go.jp/bib/027833504
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215