2015 IEEE 33rd VLSI test symposium : (VTS 2015) : Napa, California, USA : 27-29 April 2015 : TTTC-sponsored technical meetings : Apr 2015, Napa, CA.

Call No. (NDL): M17-17-2069
Bibliographic ID of National Diet Library: 027833901

Material type: 図書

Author: IEEE VLSI Test Symposium (33rd : 2015 : Napa, Calif.)

Publisher: IEEE

Publication date: [2015]

Material Format: Paper

Capacity, size, etc.: 274 pages ; 28 cm

NDC: -

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Notes on use

Note (General)：: Papers and abstracts."Welcome to VTS 2015, the thirty third in a series of annual symposia ..."--Foreword."In addition to the three-day technical prog...

Other physical details：: illustrations

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Paper

Material Type: 図書
ISBN: 9781479975983
Title: 2015 IEEE 33rd VLSI test symposium : (VTS 2015) : Napa, California, USA : 27-29 April 2015 : TTTC-sponsored technical meetings : Apr 2015, Napa, CA.
Author Heading: IEEE VLSI Test Symposium (33rd : 2015 : Napa, Calif.)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2015
Extent: 274 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Integrated circuits--Very large scale integration--Testing--Congresses.
Integrated circuits--Very large scale integration--Testing.
LCC: TK7874.75
NDLC: M17
Target Audience: 一般
Note (General): Papers and abstracts.
"Welcome to VTS 2015, the thirty third in a series of annual symposia ..."--Foreword.
"In addition to the three-day technical program, VTS 2015 features several special sessions including ... and two embedded tutorials."--Foreword.
IEEE catalog number CFP15029-POD.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-17-2069
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 027833901
http://id.ndl.go.jp/bib/027833901
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215