2016 17th Latin-American test symposium (LATS 2016) : Foz do Iguacu, Brazil : 6-8 April 2016 : LATS2016 : 17th IEEE Latin-American test symposium : Apr 2016, Foz do Iguacu, Brazil.

Author: Latin-American Test Symposium (17th : 2016 : Foz do Iguaçu, Brazil)

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Note (General)：: Program, abstracts and papers."This year LATS offers an excellent Technical Program, which is composed of ... and 2 TTEP Tutorials."--Welcome message....

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Material Type: 図書
ISBN: 9781509013326 (print-on-demand)
Title: 2016 17th Latin-American test symposium (LATS 2016) : Foz do Iguacu, Brazil : 6-8 April 2016 : LATS2016 : 17th IEEE Latin-American test symposium : Apr 2016, Foz do Iguacu, Brazil.
Author Heading: Latin-American Test Symposium (17th : 2016 : Foz do Iguaçu, Brazil)
Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
Publication Date (W3CDTF): 2016
Extent: 200 pages
Other physical details: illustrations
Size: 28 cm
Place of Publication (Country Code): US
Text Language Code: eng
Genre/Form Terms: Conference papers and proceedings.
Content Type: text
Media Type: unmediated
Carrier Type: volume
Subject Heading: Electronic apparatus and appliances--Testing--Congresses.
Electronic apparatus and appliances--Testing.
LCC: TK7870
NDLC: M17
Target Audience: 一般
Note (General): Program, abstracts and papers.
"This year LATS offers an excellent Technical Program, which is composed of ... and 2 TTEP Tutorials."--Welcome message.
IEEE catalog number CFP16LAT-POD.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-17-2412
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 028048728
http://id.ndl.go.jp/bib/028048728
Cataloging Rule: RDA
Bibliographic Record Category (NDL): 215