2016 IEEE international high level design validation and test workshop (HLDVT 2016) : Santa Cruz, California, USA : 7-8 October 2016 : 18th IEEE international high level design validation and test workshop : Oct 2016, Santa Cruz, CA.

• Material Type: 図書
• ISBN: 9781509042715 (print-on-demand)
• ISSN: 1552-6674
• Title: 2016 IEEE international high level design validation and test workshop (HLDVT 2016) : Santa Cruz, California, USA : 7-8 October 2016 : 18th IEEE international high level design validation and test workshop : Oct 2016, Santa Cruz, CA.
• Author Heading: IEEE International High-Level Design Validation and Test Workshop (18th : 2016 : Santa Cruz, Calif.)
• Publication, Distribution, etc.: Piscataway, NJ : IEEE (出版)
• Publication Date: [2016]; 著作権日付 : ©2016
• Publication Date (W3CDTF): 2016
• Extent: 184 pages
• Other physical details: illustrations
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Microprocessors--Testing--Congresses.; Electronic circuits--Testing--Congresses.; Integrated circuits--Design and construction--Congresses.; Integrated circuits--Verification--Congresses.; Electronic Digital Computers--Evaluation.; Electronic Circuits.; Computer Software--Verification.
• LCC: TK7874.58
• NDLC: M17
• Target Audience: 一般
• Note (General): Abstracts and papers.; "In addition to the two keynote talks and three tutorials, the program includes ..."--Welcome message.; IEEE catalog number CFP16HLD-POD.
• Note (Content): Annotation
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-18-888
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028341068; http://id.ndl.go.jp/bib/028341068
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215